University of Michigan-Ann Arbor, May 8-9, 2000
Attendee List and E-Mail Addresses
Presentation Title |
Presenter |
Tutorial: Thin Film Characterization by SE and Modeling |
G.E. Jellison |
P. Hess |
|
Modeling the |
F. H. Pollak |
J. Bao |
|
Spectroscopic Ellipsometric |
C. Hayzelden |
Application of Real |
P. Rovira |
Phase Modulated Ellipsometry |
J. Blanco |
Multichannel Muller |
J. Lee |
Integrated |
J-L Stehle |
Overview |
T. Ogawa |
Characterization of |
A. Diebold |
J. N. Cox |
|
P. Schiavone |
|
C. Pickering |
|
H. Hovel |
|
P. Boher |
|
In |
F.L. Terry |
Broad Spectral |
J. A. Zapien |
In Situ Spectral Transmission Measurements of Thin Films |
L. Kamlet |
In Situ Monitoring |
R. Clarke |