Professional interests

Techniques (especially nondestructive) for characterization of electronic materials and nanostructures; in situ process monitoring; control of semiconductor processes; physics of solid state devices; insulated gate transistor physics and technology; properties of electronic materials and their effects on devices; reliability of semiconductor devices, particularly in hostile environments.

Current Research Activities

Short and mid-infrared spectroscopy for remote chemical detection and identification. Use of computational scattering theories to model the infrared scattering spectrum of particulate materials and their interactions with substrate materials. Techniques for accurate calibration of infrared remote sensors.

Education

Massachusetts Institute of Technology, Cambridge, Massachusetts

Ph.D. degree, June, 1985, Department of Electrical Engineering and Computer Science. Thesis under Professor S. D. Senturia on “Electron Traps and Interface State Generation in Nitrided Oxides.”

M.S. and B.S. degrees in Electrical Engineering, June, 1981. Thesis entitled “A New Silicon Oxynitride Process for MIS Devices.” Curriculum concerned classical and quantum physics, circuit design, linear systems analysis, computer programming and elementary computer architecture, applied and abstract mathematics.

Full CV

External Links of Interest

• University of Michigan Maps – Maps to U-M and the Ann Arbor Area
• The University of Michigan Home Page – U of M main page

Personal

• Fund Raising for Multiple Sclerosis – My Personal Charitable Fund Raising Activity
• Fredville, Missouri, USA – Never Been There, But One of My Favorite Places